This involves the development and delivery of research, teaching, and consultancy, utilising scanning electron microscopy (SEM) (SEM), scanning transmission electron microscopy (STEM), energy dispersive X-ray spectroscopy (EDS), atomic force microscopy (AFM), and confocal laser scanning microscopy (CLSM).
We have extensive experience of delivering SEM and EDS analysis consultancy services to a wide range of commercial clients.
Please contact us for further details.
He is a Fellow of The Royal Microscopical Society, and member of The European Microscopy Society, a peer reviewer for scientific journals, a co-inventor on a number of international patents, and welcomes applications and suggestions for research collaborations.
Dr Jonathan Salvage BSc PhD FRMS